Fast electrical impedance tomography based on code-division-multiplexing using orthogonal codes

Martin Gevers, Patrik Gebhardt, Stephan Westerdick, Michael Vogt, Thomas Musch

In: IEEE Transactions on Instrumentation and Measurement (5), S. 1188-1195.


Abstract

http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?reload=true&punumber=19&isnumber=7079553

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