Automated Measurements of Complex Scattering Parameters

Ilona Rolfes, Bianca Will

German Microwave Conference (GeMiC 2008), ITG-FB 206, pp. 1-4, Hamburg, March 10-12, 2008


Abstract

In this article, the automation of calibrated vector network analyzer measurements is presented. Aiming at a userfriendly and optimized measurement setup for the determination of the complex scattering parameters of one-, two- or even multi-port devices, a measurement method is described which reduces the number of required connector contacts by the user. An integration of the proposed setup into a network analyzer system is possible. Thus, a measurement system being fast and automatically calibrated at its measurement ports becomes realizable. The calibration is repeatable without having to remove the device under test (DUT) from the measurement ports. For the elimination of the influence of additional cables which might be needed for the connection of the DUT, a complimentary measurement of the used cables in transmission as well as in reflection with a reflection standard placed at the phase reference plane is sufficient.

[IEEE Library]

Tags: