Cha­rac­te­ri­zing sur­face pro­files uti­li­zing mm-wa­ve FMCW SAR ima­ging

Jan Barowski, Dennis Pohle, Timo Jaeschke, Nils Pohl, Ilona Rolfes

45th European Microwave Conference (EuMC), pp. 446-449, DOI: 10.1109/EuMC.2015.7345796; Paris, France, Sep 6-11, 2015


Abstract

In this paper the results from characterizing complex surface profiles with a synthetic aperture radar operating at frequencies up to approx. 250 GHz are presented. The radar uses a bandwidth of 38GHz and a maximum synthetic aperture of 40 cm times 40 cm and is thus rectangular and uniformly sampled. A fast parallel backprojection algorithm that can be used with general purpose GPUs is used for image reconstruction. The performance of the measurement system is evaluated with respect to the range- and cross-range-resolution as well as the overall measurement error on a given reference surface. Also the measurement performance on sharp edges is considered.

[IEEE Library]

Tags: radar