A Fault Tolerant Approach to Detect Transient Faults in Microprocessors Based on a Non-Intrusive Reconfigurable Hardware

J. R. Azambuja, S. Pagliarini, M. Altieri, F. L. Kastensmidt, Michael Hübner, J. Becker, G. Foucard, R. Velazco

IEEE Transactions on Nuclear Science, 2012 Band 59, S. 1117-1124

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