Error Vector Magnitude as a Performance Measure for Advanced Modulation Formats

R. Schmogrow, B. Nebendahl, M. Winter, A. Josten, D. Hillerkuss, S. König, J. Meyer, M. Dreschmann, Michael Hübner, C. Koos, J. Becker, W. Freude, J. Leuthold

Photonics Technology Letters, IEEE (Volume: 24, Issue: 1)

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